Measurement System
EMMA series advanced technology moving probe fixtureless tester performs continuity and isolation tests simultaneously on both sides of a PCB. Current design includes four/eight moving probes, high-speed closed loop servo/linear motors, advanced technology firmware and easy to use 'Windows' interface. The EMMA series testers will lower your overall electrical test cost while dramatically improving productivity.
HVS (High Voltage Stress Test) is a revolutionary measuring system developed by MicroCraft for detecting High Resistance Isolation defects in high speed vs. using conventional Resistance measurement. HVS, similar to PDM, inspects ALL NETs once (not redundantly like resistance). This method is much faster to conventional resistance measurements. By applying high voltage pulses between signal points, you can achieve faster Isolation tests with more measurement capabilities. Existing system can be upgraded with the HVS option.
Precision Resistance Measurement
A 4 wire, 4 point measurement utilizing Kelvin Probe is available as an option. Also, a Buried Resistance option can measure and store buried resistance.
| Min. resolution: 0.001mΩ Also can check probe contact error |
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| Range | Resolution | Practical range | Current | Application |
| 4mΩ | 0.001mΩ | 0.4-3mΩ | 150mA | With Kelvin Probe |
| 40mΩ | 0.01mΩ | 2-30mΩ | 125mA | With Kelvin Probe |
| 400mΩ | 0.1mΩ | 30-300mΩ | 125mA | With Kelvin Probe |
| 4Ω | 1mΩ | 0.3-3Ω | 125mA | With Kelvin Probe |
| 10Ω | 2.5mΩ | 0.5-8Ω | 10mA | |
| 100Ω | 25mΩ | 5-80Ω | 10mA | |
| 1000Ω | 250mΩ | 50-800Ω | 2.65mA | |
| 10kΩ | 2.5Ω | 500-8kΩ | 0.265mA | |
| 100kΩ | 25Ω | 5k-80kΩ | 26.5µA | When measuring buried resistor |
| 1MΩ | 250Ω | 50k-800kΩ | 2.65µA | When measuring buried resistor |
Contact Check During Isolation Testing
This feature enables you to verify good probe contact with pad before test. This improves the accuracy of isolation testing. Furthermore, this feature allows for pad searching function as well.
Latent Test is the Highest Technology in Fault detection. Latent not only detects the existing defects but also the dormant ones having the possibility of becoming a permanent defect in the near future. This is turn enhances the product reliability.
Non linear Conductivity caused by a change in resistance due to the increase in current induced temperature.
EMMA series tester comes standard with isolation resistance test with applied voltage of 30 to 250V and optional high voltage resistance test with applied voltage of 1 to 250V/500V/1000V quite reliably.
Connecting to external measuring meter controlled and operated through GPIB interface and Ethernet allows the 1Tohm extreme isolation measurement, and high voltage measurement, LCR and diode measurement.
In Isolation test, a sudden application of high voltage may result in burning out of parts containing Micro short and it may happen that the carbonized residue may react with water particles in the air or gases inside the factory and may cause the element to relapse as high resistance short error after the completion of the test. Our Micro-short test avoids such damage and trouble by applying a low voltage less than 30V before applying the high. Again, the high resistance short between multiple layers of a board may possess the characteristics of semiconductor and capacitors. These errors can also be detected in our test by reversing the polarity of high voltage.
